Feature Vector Based Analysis of Hyperspectral Crop Reflectance Data for Discrimination and Quantification of Fungal Disease Severity in Wheat

Hamed Hamid Muhammed, Anders Larsolle
  • Biosystems Engineering, October 2003, Elsevier
  • DOI: 10.1016/s1537-5110(03)00090-4

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http://dx.doi.org/10.1016/s1537-5110(03)00090-4

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