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This page is a summary of: Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation1This work is dedicated to Professor Dr Guenther Schoeck on the occasion of his 70th birthday.1, Acta Materialia, February 1999, Elsevier,
DOI: 10.1016/s1359-6454(98)00366-8.
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