Low current MeV Au2+ ion-induced amorphization in silicon: Rutherford backscattering spectrometry and transmission electron microscopy study

J. Kamila, B. Satpati, D.K. Goswami, M. Rundhe, B.N. Dev, P.V. Satyam
  • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, July 2003, Elsevier
  • DOI: 10.1016/s0168-583x(03)00459-2

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http://dx.doi.org/10.1016/s0168-583x(03)00459-2

The following have contributed to this page: Biswarup Satpati