Large volume serial section tomography by Xe Plasma FIB dual beam microscopy

T.L. Burnett, R. Kelley, B. Winiarski, L. Contreras, M. Daly, A. Gholinia, M.G. Burke, P.J. Withers
  • Ultramicroscopy, February 2016, Elsevier
  • DOI: 10.1016/j.ultramic.2015.11.001

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http://dx.doi.org/10.1016/j.ultramic.2015.11.001

The following have contributed to this page: Professor Philip J Withers