Ranking TEM cameras by their response to electron shot noise

Patricia Grob, Derek Bean, Dieter Typke, Xueming Li, Eva Nogales, Robert M. Glaeser
  • Ultramicroscopy, October 2013, Elsevier
  • DOI: 10.1016/j.ultramic.2013.01.003

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http://dx.doi.org/10.1016/j.ultramic.2013.01.003

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