Rotating polarizer-analyzer scanning ellipsometer

  • Taher M. El-Agez, Ahmed A. El Tayyan, Sofyan A. Taya
  • Thin Solid Films, July 2010, Elsevier
  • DOI: 10.1016/j.tsf.2010.04.067

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http://dx.doi.org/10.1016/j.tsf.2010.04.067

The following have contributed to this page: Prof. Sofyan A Taya