Exploring microstructural changes associated with oxidation in Ni–YSZ SOFC electrodes using high resolution X-ray computed tomography

P.R. Shearing, R.S. Bradley, J. Gelb, F. Tariq, P.J. Withers, N.P. Brandon
  • Solid State Ionics, May 2012, Elsevier
  • DOI: 10.1016/j.ssi.2011.10.015

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http://dx.doi.org/10.1016/j.ssi.2011.10.015

The following have contributed to this page: Professor Philip J Withers