The exposure data landscape for manufactured chemicals

  • Peter P. Egeghy, Richard Judson, Sumit Gangwal, Shad Mosher, Doris Smith, James Vail, Elaine A. Cohen Hubal
  • The Science of The Total Environment, January 2012, Elsevier
  • DOI: 10.1016/j.scitotenv.2011.10.046

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http://dx.doi.org/10.1016/j.scitotenv.2011.10.046

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