Publication not explained

This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.

If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.

Featured Image

Read the Original

This page is a summary of: Large-area profile measurement of sinusoidal freeform surfaces using a new prototype scanning tunneling microscopy, Precision Engineering, April 2014, Elsevier,
DOI: 10.1016/j.precisioneng.2013.12.008.
You can read the full text:

Read

Contributors

The following have contributed to this page