This shareable PDF can be hosted on any platform or network and is fully compliant with publisher copyright.
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
This page is a summary of: Quality control and authentication of packaged integrated circuits using enhanced-spatial-resolution terahertz time-domain spectroscopy and imaging, Optics and Lasers in Engineering, July 2017, Elsevier,
DOI: 10.1016/j.optlaseng.2017.07.007.
You can read the full text:
The following have contributed to this page
