Microstructural study of dynamically annealed c-Si using MeV N+ ions

P.K. Sahoo, B. Satpati, P.V. Satyam, A. Pradhan, V.N. Kulkarni
  • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, March 2007, Elsevier
  • DOI: 10.1016/j.nimb.2006.12.016

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.nimb.2006.12.016

The following have contributed to this page: Biswarup Satpati