High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

A. Steuwer, J.R. Santisteban, M. Turski, P.J. Withers, T. Buslaps
  • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, August 2005, Elsevier
  • DOI: 10.1016/j.nimb.2005.06.049

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http://dx.doi.org/10.1016/j.nimb.2005.06.049

The following have contributed to this page: Professor Philip J Withers