Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials

Vikash Mishra, M. Kamal Warshi, Aanchal Sati, Anil Kumar, Vinayak Mishra, Archna Sagdeo, Rajesh Kumar, Pankaj R. Sagdeo
  • Materials Science in Semiconductor Processing, November 2018, Elsevier
  • DOI: 10.1016/j.mssp.2018.06.025

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The following have contributed to this page: Professor Pankaj R Sagdeo