Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials

Vikash Mishra, M. Kamal Warshi, Aanchal Sati, Anil Kumar, Vinayak Mishra, Archna Sagdeo, Rajesh Kumar, Pankaj R. Sagdeo
  • Materials Science in Semiconductor Processing, November 2018, Elsevier
  • DOI: 10.1016/j.mssp.2018.06.025

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.mssp.2018.06.025

The following have contributed to this page: Professor Pankaj R Sagdeo