Influence of experimental factors and film thickness on the measured critical load in the nanoscratch test

  • B.D. Beake, A.A. Ogwu, T. Wagner
  • Materials Science and Engineering A, May 2006, Elsevier
  • DOI: 10.1016/j.msea.2005.09.121

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http://dx.doi.org/10.1016/j.msea.2005.09.121

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