Comparative analysis of parameter extraction techniques for AlGaN/GaN HEMT on silicon/sapphire substrate

  • Shubhankar Majumdar, Ankush Bag, Dhrubes Biswas
  • Microelectronics Reliability, November 2017, Elsevier
  • DOI: 10.1016/j.microrel.2017.08.016

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http://dx.doi.org/10.1016/j.microrel.2017.08.016

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