Influence of temperature on the actuation voltage of RF-MEMS switches

V. Mulloni, F. Solazzi, F. Ficorella, A. Collini, B. Margesin
  • Microelectronics Reliability, May 2013, Elsevier
  • DOI: 10.1016/j.microrel.2013.01.007

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http://dx.doi.org/10.1016/j.microrel.2013.01.007

The following have contributed to this page: Viviana Mulloni