Evaluation of MODIS surface reflectance products for wheat leaf area index (LAI) retrieval

  • Yonghong Yi, Dawen Yang, Jingfeng Huang, Daoyi Chen
  • ISPRS Journal of Photogrammetry and Remote Sensing, November 2008, Elsevier
  • DOI: 10.1016/j.isprsjprs.2008.04.004

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http://dx.doi.org/10.1016/j.isprsjprs.2008.04.004

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