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This page is a summary of: Emissivity Measurements of Vanadium Dioxide Thin Films through the Thermal Wave Resonant Cavity and its Applications in Radiative Thermal Diode and Transistor Simulations, International Journal of Heat and Mass Transfer, June 2024, Elsevier,
DOI: 10.1016/j.ijheatmasstransfer.2024.125298.
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