Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

P. Nemes-Incze, Z. Osváth, K. Kamarás, L.P. Biró
  • Carbon, September 2008, Elsevier
  • DOI: 10.1016/j.carbon.2008.06.022

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The following have contributed to this page: Dr. Zoltán Osváth