Hyperspectral Crop Reflectance Data for characterising and estimating Fungal Disease Severity in Wheat

Hamed Hamid Muhammed
  • Biosystems Engineering, May 2005, Elsevier
  • DOI: 10.1016/j.biosystemseng.2005.02.007

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http://dx.doi.org/10.1016/j.biosystemseng.2005.02.007

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