Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting

B. Winiarski, A. Gholinia, J. Tian, Y. Yokoyama, P.K. Liaw, P.J. Withers
  • Acta Materialia, March 2012, Elsevier
  • DOI: 10.1016/j.actamat.2011.12.035

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http://dx.doi.org/10.1016/j.actamat.2011.12.035

The following have contributed to this page: Professor Philip J Withers