Feature Vector Based Analysis of Hyperspectral Crop Reflectance Data for Discrimination and Quantification of Fungal Disease Severity in Wheat

Hamed Hamid Muhammed, Anders Larsolle
  • Biosystems Engineering, October 2003, Elsevier
  • DOI: 10.1016/s1537-5110(03)00090-4

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Hamed Hamid Muhammed