Evidence for high negative charge densities in AlF3 coatings on oxidized silicon: a promising source for large drift fields

Dirk König, G. Ebest, R. Scholz, S. Gemming, I. Thurzo, T.U. Kampen, D.R.T. Zahn
  • Physica E Low-dimensional Systems and Nanostructures, April 2002, Elsevier
  • DOI: 10.1016/s1386-9477(02)00399-5
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http://dx.doi.org/10.1016/s1386-9477(02)00399-5

The following have contributed to this page: Professor Dietrich RT Zahn