Transmission Electron Microscopy and Diffractometry of Materials

  • Ray Egerton
  • Micron, January 2002, Elsevier
  • DOI: 10.1016/s0968-4328(02)00002-1

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http://dx.doi.org/10.1016/s0968-4328(02)00002-1

The following have contributed to this page: Professor Ray F Egerton