Measurements of secondary electrons emitted from conductive substrates under high-current metal ion bombardment

André Anders, Gera Yu Yushkov
  • Surface and Coatings Technology, February 2001, Elsevier
  • DOI: 10.1016/s0257-8972(00)01038-0

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http://dx.doi.org/10.1016/s0257-8972(00)01038-0

The following have contributed to this page: Professor Andre Anders