Raman monitoring of wide bandgap MBE growth

Dietrich R.T. Zahn
  • Applied Surface Science, January 1998, Elsevier
  • DOI: 10.1016/s0169-4332(97)00435-2

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/s0169-4332(97)00435-2

The following have contributed to this page: Professor Dietrich RT Zahn