Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

G Salvan, C Himcinschi, A.Yu Kobitski, M Friedrich, H.P Wagner, T.U Kampen, D.R.T Zahn
  • Applied Surface Science, May 2001, Elsevier
  • DOI: 10.1016/s0169-4332(01)00069-1

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http://dx.doi.org/10.1016/s0169-4332(01)00069-1

The following have contributed to this page: Professor Dietrich RT Zahn