PTCDA film formation on Si(111):H-1×1 surface: total current spectroscopy monitoring

A.O. Morozov, T.U. Kampen, D.R.T. Zahn
  • Surface Science, February 2000, Elsevier
  • DOI: 10.1016/s0039-6028(99)01143-7

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http://dx.doi.org/10.1016/s0039-6028(99)01143-7

The following have contributed to this page: Professor Dietrich RT Zahn