Quantitative STEM normalisation: The importance of the electron flux

G.T. Martinez, L. Jones, A. De Backer, A. Béché, J. Verbeeck, S. Van Aert, P.D. Nellist
  • Ultramicroscopy, December 2015, Elsevier
  • DOI: 10.1016/j.ultramic.2015.07.010
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