Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting

A. De Backer, G.T. Martinez, K.E. MacArthur, L. Jones, A. Béché, P.D. Nellist, S. Van Aert
  • Ultramicroscopy, April 2015, Elsevier
  • DOI: 10.1016/j.ultramic.2014.11.028
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