In situ ellipsometry — A powerful tool for monitoring alkali doping of organic thin films

F. Haidu, M. Ludemann, P. Schäfer, O.D. Gordan, D.R.T. Zahn
  • Thin Solid Films, November 2014, Elsevier
  • DOI: 10.1016/j.tsf.2014.02.101

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http://dx.doi.org/10.1016/j.tsf.2014.02.101

The following have contributed to this page: Professor Dietrich RT Zahn