Investigations of the structural, optical, and electrical properties of Pb0.8Sn0.2Te layers grown on Si(100) using BaF2/CaF2 buffer

D. Ostertak, M. Friedrich, A. Velichko, V. Ilyushin, D.R.T. Zahn
  • Thin Solid Films, June 2009, Elsevier
  • DOI: 10.1016/j.tsf.2009.03.192
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http://dx.doi.org/10.1016/j.tsf.2009.03.192

The following have contributed to this page: Professor Dietrich RT Zahn