Determination of band offsets in strained-Si heterolayers

  • C.K. Maiti, S.K. Samanta, S. Chatterjee, G.K. Dalapati, S. Bhattacharya, B.M. Armstrong, H.S. Gamble, J. McCarthy, T.S. Perova, R.A. Moore
  • Thin Solid Films, September 2004, Elsevier
  • DOI: 10.1016/j.tsf.2004.05.026

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.tsf.2004.05.026

The following have contributed to this page: Professor Tatiana Perova