Vacuum ultraviolet spectroscopic ellipsometry investigations of guanine layers on H-passivated Si(111) surfaces

S.D. Silaghi, M. Friedrich, R. Scholz, T.U. Kampen, C. Cobet, N. Esser, W. Richter, W. Braun, D.R.T. Zahn
  • Thin Solid Films, May 2004, Elsevier
  • DOI: 10.1016/j.tsf.2003.11.250

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http://dx.doi.org/10.1016/j.tsf.2003.11.250

The following have contributed to this page: Professor Dietrich RT Zahn