In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates

  • Genki Yoshikawa, Tetsuhiko Miyadera, Ryo Onoki, Keiji Ueno, Ikuyo Nakai, Shiro Entani, Susumu Ikeda, Dong Guo, Manabu Kiguchi, Hiroshi Kondoh, Toshiaki Ohta, Koichiro Saiki
  • Surface Science, June 2006, Elsevier
  • DOI: 10.1016/j.susc.2006.04.012

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http://dx.doi.org/10.1016/j.susc.2006.04.012

The following have contributed to this page: Professor Koichiro Saiki and Dr Susumu Ikeda