Amorphous indium–gallium–zinc oxide thin-film transistors instability and stress evaluation by Stretched-Exponential model

  • Tsung-Hsiang Shih, Shou-Wei Fang, Jen-Yu Lee, Guan-Yu Lin, Yu-Hung Chen, Lung-Pao Hsin, Hsin-Hung Li, Chin-Wei Yang, Chien-Tao Chen, Hsiung-Hsing Lu, Kai-Chung Cheng, Chih-Yuan Lin, Chia-Yu Chen, Chun-Ming Yang, He-Ting Tsai, Yu-Hsin Lin
  • Solid-State Electronics, July 2012, Elsevier
  • DOI: 10.1016/j.sse.2012.04.001

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http://dx.doi.org/10.1016/j.sse.2012.04.001