Electrical and structural characterization of ion implanted GaN

  • M. Usman, A. Nazir, T. Aggerstam, M.K. Linnarsson, A. Hallén
  • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, May 2009, Elsevier
  • DOI: 10.1016/j.nimb.2009.01.091

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.nimb.2009.01.091

The following have contributed to this page: Dr. Muhammad Usman