MeV-ion beam analysis of the interface between filtered cathodic arc-deposited a-carbon and single crystalline silicon

T. Kamwanna, N. Pasaja, L.D. Yu, T. Vilaithong, A. Anders, S. Singkarat
  • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, December 2008, Elsevier
  • DOI: 10.1016/j.nimb.2008.09.013
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The following have contributed to this page: Professor Andre Anders