Surface characterization of thin silicon-rich oxide films

  • D. Ristić, V. Holý, M. Ivanda, M. Marciuš, M. Buljan, O. Gamulin, K. Furić, M. Ristić, S. Musić, M. Mazzola, A. Chiasera, M. Ferrari, G.C. Righini
  • Journal of Molecular Structure, May 2011, Elsevier
  • DOI: 10.1016/j.molstruc.2010.11.066

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.molstruc.2010.11.066

The following have contributed to this page: dr. Giancarlo C. Righini