Surface characterization of thin silicon-rich oxide films

  • D. Ristić, V. Holý, M. Ivanda, M. Marciuš, M. Buljan, O. Gamulin, K. Furić, M. Ristić, S. Musić, M. Mazzola, A. Chiasera, M. Ferrari, G.C. Righini
  • Journal of Molecular Structure, May 2011, Elsevier
  • DOI: 10.1016/j.molstruc.2010.11.066

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The following have contributed to this page: dr. Giancarlo C. Righini