Current conduction mechanism of MIS devices using multidimensional minimization system program

N. Rouag, Z. Ouennoughi, M. Rommel, K. Murakami, L. Frey
  • Microelectronics Reliability, June 2015, Elsevier
  • DOI: 10.1016/j.microrel.2015.05.001
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The following have contributed to this page: Dr. Mathias Rommel