Comparative analysis of yield optimized pulsed flip-flops

  • Marco Lanuzza, Raffaele De Rose, Fabio Frustaci, Stefania Perri, Pasquale Corsonello
  • Microelectronics Reliability, August 2012, Elsevier
  • DOI: 10.1016/j.microrel.2012.03.024

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http://dx.doi.org/10.1016/j.microrel.2012.03.024

The following have contributed to this page: Dr Marco Lanuzza