Comparative analysis of yield optimized pulsed flip-flops

  • Marco Lanuzza, Raffaele De Rose, Fabio Frustaci, Stefania Perri, Pasquale Corsonello
  • Microelectronics Reliability, August 2012, Elsevier
  • DOI: 10.1016/j.microrel.2012.03.024

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Dr Marco Lanuzza