Recent improvements in the integration of field emitters into scanning probe microscopy sensors

S. Beuer, M. Rommel, S. Petersen, B. Amon, Th. Sulzbach, W. Engl, A.J. Bauer, H. Ryssel
  • Microelectronic Engineering, May 2008, Elsevier
  • DOI: 10.1016/j.mee.2008.01.048
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The following have contributed to this page: Dr. Mathias Rommel