Performance and reliability of ultra-thin oxide nMOSFETs under variable body bias

  • F. Crupi, L. Magnelli, P. Falbo, M. Lanuzza, M. Nafría, R. Rodríguez
  • Microelectronic Engineering, September 2007, Elsevier
  • DOI: 10.1016/j.mee.2007.04.015

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The following have contributed to this page: Dr Marco Lanuzza