Interface study of ion irradiated Cu/Ni/Cu(002)/Si magnetic thin film by X-ray reflectivity

T.G. Kim, J.H. Lee, J.H. Song, K.H. Chae, S.W. Shin, H.M. Hwang, J. Lee, K. Jeong, C.N. Whang, J.-S. Lee, K.-B. Lee
  • Journal of Magnetism and Magnetic Materials, April 2006, Elsevier
  • DOI: 10.1016/j.jmmm.2005.03.096

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http://dx.doi.org/10.1016/j.jmmm.2005.03.096

The following have contributed to this page: Dr Keun Hwa Chae