Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces

A. Bilbao-Guillerna, R.T. Eachambadi, G.B.J. Cadot, D.A. Axinte, J. Billingham, F. Stumpf, S. Beuer, M. Rommel
  • Journal of Materials Processing Technology, February 2018, Elsevier
  • DOI: 10.1016/j.jmatprotec.2017.10.024
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The following have contributed to this page: Dr. Mathias Rommel