Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

  • A.N. Danilewsky, J. Wittge, A. Croell, D. Allen, P. McNally, P. Vagovič, T. dos Santos Rolo, Z. Li, T. Baumbach, E. Gorostegui-Colinas, J. Garagorri, M.R. Elizalde, M.C. Fossati, D.K. Bowen, B.K. Tanner
  • Journal of Crystal Growth, March 2011, Elsevier
  • DOI: 10.1016/j.jcrysgro.2010.10.199

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1016/j.jcrysgro.2010.10.199

The following have contributed to this page: Dr Zhi Juan Li

Contributors