Thin organic heterostructures deposited via organic vapor phase deposition: spectroscopic ellipsometry characterization

C. Himcinschi, S. Hartmann, A. Janssen, N. Meyer, M. Friedrich, W. Kowalsky, D.R.T. Zahn, M. Heuken
  • Journal of Crystal Growth, February 2005, Elsevier
  • DOI: 10.1016/j.jcrysgro.2004.11.127
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http://dx.doi.org/10.1016/j.jcrysgro.2004.11.127

The following have contributed to this page: Professor Dietrich RT Zahn