Investigation of complex channel capacitance in C60 field effect transistor and evaluation of the effect of grain boundaries

  • Tetsuhiko Miyadera, Manabu Nakayama, Susumu Ikeda, Koichiro Saiki
  • Current Applied Physics, January 2007, Elsevier
  • DOI: 10.1016/j.cap.2006.01.054

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http://dx.doi.org/10.1016/j.cap.2006.01.054

The following have contributed to this page: Professor Koichiro Saiki and Dr Susumu Ikeda