Hyperspectral Crop Reflectance Data for characterising and estimating Fungal Disease Severity in Wheat

Hamed Hamid Muhammed
  • Biosystems Engineering, May 2005, Elsevier
  • DOI: 10.1016/j.biosystemseng.2005.02.007

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Hamed Hamid Muhammed