Angle resolved XPS for selective characterization of internal and external surface of porous silicon

Anna Lion, Nadhira Laidani, Paolo Bettotti, Chiara Piotto, Giancarlo Pepponi, Mario Barozzi, Marina Scarpa
  • Applied Surface Science, June 2017, Elsevier
  • DOI: 10.1016/j.apsusc.2017.02.099
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The following have contributed to this page: Dr Paolo Bettotti